Affiliation of Author(s):微电子与通信工程学院
Journal:IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Key Words:Aerospace electronics; electrostatic discharge (ESD); radiation hardening; single-event latch-up (SEL); total ionizing dose (TID); wireline driver
Co-author:Gao Xingguo(外),Xiang Xun(外),Liu Fan(外),李明东(学),黄莎琳(学),Chen Xuewen(外),周喜川,胡盛东,林智,Amine Bermak(外)
First Author:Xiang Xun
Indexed by:Journal paper
Correspondence Author:唐枋
Document Code:205212
Volume:65
Page Number:566-572
ISSN No.:0018-9499
Translation or Not:no
Date of Publication:2018-01-01