Affiliation of Author(s):微电子与通信工程学院
Journal:IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Key Words:Aerospace electronics; analog integrated circuit; CMOS voltage reference; radiation hardening; single-event latch-up; voltage drift
Co-author:Yang Feng,Liu Fan,Wang Han,Xiang Xun,周喜川,胡盛东,林智,Bermak Amine
First Author:LiuFan
Indexed by:Journal paper
Correspondence Author:唐枋
Document Code:151592
Volume:64
Issue:9
Page Number:6
ISSN No.:0018-9499
Translation or Not:no
Date of Publication:2017-01-01