Qingkai Qian

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9. Q. Qian, B. Li, M. Hua, Z. Zhang, F. Lan, Y. Xu, R. Yan, and K. J. Chen, "Improved Gate Dielectric Deposition and Enhanced Electrical Stability for Single-Layer MoS2 MOSFET with an AlN Interfacial Layer," Sci. Rep. 6, 27676, 2016
Release time:2022-04-03  Hits:

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